XRD:
We accept solid samples in the form of dry powder (300 mesh) for analysis in powder mode. For thin film analysis, the sample should be prepared on a glass slide measuring 2 cm × 3.5 cm with a thickness of 0.2 cm, ensuring a uniform layer of 2 cm × 1.5 cm on one side. Thin films prepared on other substrates, such as silicon wafers or flexible thin films, are also accepted. However, only powder samples are allowed for high-temperature analysis. In special cases, XRD analysis of smaller sample quantities or user-specific sample preparations may be accommodated. Please note that liquid or gas samples cannot be analyzed using this facility.
XRF:
For the estimation of major and minor element oxides and qualitative analysis, a solid sample in the form of dry powder (~200 mesh) with a minimum quantity of 10 g is required. For trace element analysis of geological samples, at least 20 g of the sample is needed. Sample preparation facilities, including jaw crushing and pulverization, are available. This facility does not support the analysis of liquid or gas samples. For solid samples, like metal coins, PVC pipe, etc., no such sample preparation is necessary.
TGA:
Both powder and liquid samples are accepted for analysis. However, the sample must not be poisonous, explosive, or capable of releasing toxic or obnoxious gases/fumes upon heating. It should also be non-corrosive and must not cause any damage to the instrument or sample pan/holder.
DSC:
The sample should be in powder/liquid form. Similar to TGA, it must not be poisonous, explosive, or capable of releasing toxic or obnoxious gases/fumes upon heating. Additionally, the sample should be non-corrosive and must not pose any risk to the DSC thermocouple sensor or sample pan.